The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2015
Filed:
Apr. 07, 2010
Satoru Chida, Hitachinaka, JP;
Hirokazu Iwamatsu, Hitachinaka, JP;
Kano Shimizu, Hitachinaka, JP;
Kazuhiro Nakamura, Naka, JP;
Kiyotaka Umino, Mito, JP;
Satoru Chida, Hitachinaka, JP;
Hirokazu Iwamatsu, Hitachinaka, JP;
Kano Shimizu, Hitachinaka, JP;
Kazuhiro Nakamura, Naka, JP;
Kiyotaka Umino, Mito, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
The present invention provides an automatic analyzer, in which when a specimen that cannot be analyzed due to an abnormality or needs to be remeasured exists, the automatic analyzer can swiftly reload the specimen that cannot be analyzed due to the abnormality or needs to be remeasured without waiting for completion of a measurement of another specimen held by a rack holding the specimen that cannot be analyzed or needs to be remeasured. The automatic analyzer has means for storing information of a rack loaded in the analyzer and specimen information, displaying identification information of the rack loaded in the analyzer to a user, specifying a specimen that needs to be reanalyzed due to an abnormality or needs to be collected for a remeasurement, interrupting analysis of a specimen rack holding the specimen, and collecting the specimen rack. The automatic analyzer can collect and reload the specified specimen.