The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Oct. 28, 2013
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Stephan Jourdan, Portland, OR (US);

Adi Yoaz, Austin, TX (US);

Mattan Erez, Cupertino, CA (US);

Ronny Ronen, Haifa, IL;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/00 (2006.01); G06F 9/44 (2006.01); G06F 9/38 (2006.01);
U.S. Cl.
CPC ...
G06F 9/3861 (2013.01); G06F 9/3848 (2013.01);
Abstract

Methods and apparatus for restoring a meta predictor system upon detecting a branch or binary misprediction, are disclosed. An example apparatus may include a base misprediction history register to store a set of misprediction history values each indicating whether a previous branch prediction taken by a previous branch instruction was predicted correctly or incorrectly. The apparatus may comprise a meta predictor to detect a branch misprediction of a current branch prediction based at least in part on an output of the base misprediction history register. The meta predictor may restore the base misprediction history register based on the detecting of the branch misprediction. Additional apparatus, systems, and methods are disclosed.


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