The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Apr. 28, 2011
Applicants:

Jeffrey Drue David, San Jose, CA (US);

Dominic J. Benvegnu, La Honda, CA (US);

Xiaoyuan HU, Milpitas, CA (US);

Inventors:

Jeffrey Drue David, San Jose, CA (US);

Dominic J. Benvegnu, La Honda, CA (US);

Xiaoyuan Hu, Milpitas, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G05B 13/02 (2006.01); B24B 49/00 (2012.01); B24B 1/00 (2006.01); B24B 7/00 (2006.01); G01C 25/00 (2006.01); G01B 5/02 (2006.01); G06F 7/60 (2006.01); C03C 15/00 (2006.01); H01L 21/00 (2006.01); G01R 31/26 (2014.01); H01L 21/302 (2006.01); B24B 49/12 (2006.01); B24B 37/04 (2012.01); B24B 37/013 (2012.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
B24B 37/013 (2013.01); B24B 49/12 (2013.01); B24B 37/042 (2013.01); G01N 21/84 (2013.01); G01N 2021/8416 (2013.01);
Abstract

A method of generating a library of reference spectra includes storing an optical model for a layer stack having at a plurality of layers, receiving user input identifying a set of one or more refractive index functions and a set of one or more extinction coefficient functions a first layer from the plurality of layers, wherein the set of one or more refractive index functions includes a plurality of different refractive index functions or the set of one or more extinction coefficient functions includes a plurality of different extinction coefficient functions, and for each combination of a refractive index function from the set of refractive index functions and an extinction coefficient function from the set of extinction coefficient functions, calculating a reference spectrum using the optical model based on the refractive index function, the extinction coefficient function and a first thickness of the first layer.


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