The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Oct. 19, 2012
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Heino Heise, Adelebsen, DE;
Ulrich Kohlhaas, Goettingen, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01); G02B 21/34 (2006.01); G01N 1/28 (2006.01); G01N 15/06 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/34 (2013.01); G01N 1/2813 (2013.01); G01N 15/0625 (2013.01); G01N 2015/0042 (2013.01);
Abstract
A filter holder for correlative particle analysis during imaging microscopy methods or methods of the elemental analysis including a receiving element with a filter support and a fastening unit. The plane filter support is designed as pressure piece and is movably arranged in the receiving element to be movable at a right angle to the surface of the filter for the purpose of tensioning the filter. The fastening unit includes a clamping element which encloses the filter at the circumference of the filter and is held by a tensioning element which is supported in the receiving element.