The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Sep. 18, 2013
Applicant:

Varian Semiconductor Equipment Associates, Inc., Gloucester, MA (US);

Inventors:

Richard J. Hertel, Boxford, MA (US);

Ernest E. Allen, Jr., Rockport, MA (US);

Philip J. McGrail, Jr., Northwood, NH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 5/00 (2006.01); G21K 5/08 (2006.01); H01J 37/20 (2006.01); C23C 14/48 (2006.01); C23C 14/50 (2006.01); G11B 5/84 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); C23C 14/48 (2013.01); C23C 14/505 (2013.01); G11B 5/84 (2013.01);
Abstract

A processing apparatus includes a process chamber defining an enclosed volume, and a dual sided workpiece assembly disposed in the enclosed volume. The dual sided workpiece assembly includes a base portion and a flip portion coupled to the base portion. The flip portion has a support surface configured to support at least one dual sided workpiece and is configured to rotate about a flipping axis. The processing apparatus also includes a controller configured to control the dual sided workpiece assembly to expose a first side of the at least one dual sided workpiece to accelerating ions in the process chamber during a first time interval and to expose a second side of the at least one dual sided workpiece to accelerating ions during a second time interval different than the first time interval by rotating the flip portion about the flipping axis.


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