The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2015
Filed:
Aug. 22, 2012
Mark Lawrence Delaney, Shoreline, WA (US);
Mark Lawrence Delaney, Shoreline, WA (US);
Mitutoyo Corporation, Kawasaki-shi, JP;
Abstract
A machine vision inspection system comprises an optical portion providing an image of a field of view of a workpiece which may be a magnified image. A first camera and a second camera provide first and second images of a shared or common field of view of the workpiece and are arranged such that the orientation of the common field of view imaged in the first camera is rotated relative to the orientation of the common field of view imaged in the second camera. Signal processing provides an edge measurement of an edge feature within the common field of view and determines which of the first and second images is used as a basis for the edge measurement based on whether their respective edge orientation (with respect to the pixel array of each camera) differs from the pixel array orientation of their associated camera by an orientation difference threshold amount.