The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2015
Filed:
Nov. 12, 2009
Isao Yamazaki, Ryugasaki, JP;
Hiroaki Ishizawa, Hitachinaka, JP;
Sakuichiro Adachi, Kawasaki, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
There is provided a high-accuracy automatic analysis device achieving both of measurement in a wide concentration range and high sensitivity at a low concentration. The signals of a plurality of wavelengths λto λwhere the sensitivity of light absorption caused by fine particles is high from a light sourceare converted to absorbances by a spectroscopic optical system (detector). The absorbances are converted to a secondary parameter from in which a noise component is cancelled by using a previously-defined conversion table, so that a concentration of a measured material (predetermined component) is calculated by an operation unit (calculating means)based on the secondary parameter. Thus, analysis being resistant to the noise even at the low concentration can be achieved in a range up to a high concentration.