The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2015

Filed:

Dec. 06, 2013
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Kie Y. Ahn, Chappaqua, NY (US);

Leonard Forbes, Corvallis, OR (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/3205 (2006.01); H01L 21/4763 (2006.01); H01L 49/02 (2006.01); H01L 21/28 (2006.01); H01L 29/792 (2006.01); H01L 29/51 (2006.01); H01L 21/314 (2006.01); C23C 16/455 (2006.01); H01L 29/788 (2006.01); H01L 21/316 (2006.01); C23C 16/40 (2006.01);
U.S. Cl.
CPC ...
H01L 29/788 (2013.01); H01L 28/40 (2013.01); H01L 21/28194 (2013.01); H01L 29/792 (2013.01); H01L 21/28273 (2013.01); H01L 29/513 (2013.01); H01L 21/3142 (2013.01); H01L 29/517 (2013.01); C23C 16/45529 (2013.01); C23C 16/4554 (2013.01); C23C 16/45553 (2013.01); H01L 21/28282 (2013.01); H01L 21/31604 (2013.01); C23C 16/40 (2013.01);
Abstract

Apparatus having a dielectric containing scandium and gadolinium can provide a reliable structure with a high dielectric constant (high k). In an embodiment, a monolayer or partial monolayer sequence process, such as for example atomic layer deposition (ALD), can be used to form a dielectric containing gadolinium oxide and scandium oxide. In an embodiment, a dielectric structure can be formed by depositing gadolinium oxide by atomic layer deposition onto a substrate surface using precursor chemicals, followed by depositing scandium oxide onto the substrate using precursor chemicals, and repeating to form a thin laminate structure. A dielectric containing scandium and gadolinium may be used as gate insulator of a MOSFET, a capacitor dielectric in a DRAM, as tunnel gate insulators in flash memories, as a NROM dielectric, or as a dielectric in other electronic devices, because the high dielectric constant (high k) of the film provides the functionality of a much thinner silicon dioxide film.


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