The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2015
Filed:
Oct. 07, 2009
Konrad Lex, Koenigsdorf, DE;
Konrad Lex, Koenigsdorf, DE;
BYK-Gardner GmbH, , DE;
Abstract
An apparatus for determining optical properties of materials including a first measuring device having a first radiation device which directs radiation onto the material under a first specified angle of radiation and a first radiation detection device which is located under a first angle of reception with respect to the material, and a second measuring device which includes a second radiation device which directs radiation onto the material under a second specified angle of radiation and a second radiation detection device which is located at a second angle of reception with respect to the material and allows a locally resolved evaluation of the radiation incident thereon and emits at least one second characteristic signal which is characteristic of the radiation incident on the second radiation detection device.