The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2015
Filed:
May. 11, 2011
Richard Gary Mcdaniel, Hightstown, NJ (US);
Richard Gary McDaniel, Hightstown, NJ (US);
Siemens Aktiengesellschaft, Munich, DE;
Abstract
An overdraw method for editing a three-dimensional geometry includes receiving a three-dimensional geometry including a plurality of individual curves whose positions are defined by a plurality of control points, receiving a polyline overdrawn on the three-dimensional geometry, matching the polyline to the three-dimensional geometry to determine a portion of the three-dimensional geometry being modified, recognizing a shape feature of the polyline to determine a shape modification to apply to the three-dimensional geometry, shifting the three-dimensional geometry to determine a modified geometry by changing a position of at least one of the control points towards the polyline, and matching the modified geometry with at least one symmetry operator to determine whether the changed position satisfies a constraint and applying the constraint to the modified geometry to further modify the modified geometry.