The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2014

Filed:

Mar. 08, 2013
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Hideki Itai, Hitachinaka, JP;

Zhigang Wang, Hitachinaka, JP;

Kazunari Asao, Naka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01); G06K 9/46 (2006.01); G06T 5/00 (2006.01); G01N 23/225 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4647 (2013.01); G01N 2223/42 (2013.01); G06T 2207/10061 (2013.01); G06T 5/007 (2013.01); G01N 23/2254 (2013.01);
Abstract

In order to solve the problem that the resolution of a back-scattered electron image without a contrast difference between materials with close atomic numbers is low, an image processing apparatus that performs an image process on a back-scattered electron image as an input image includes: a material peak detection unit that determines a peak luminance value with a peak of a frequency of a luminance histogram based on a luminance value obtained for each measurement position by using the input image as an input and information about material-dependent back-scattered electron generation efficiency, and that outputs the peak luminance value for each material; and an image information adjustment unit that emphasizes a material-dependent contrast on the basis of the input image and the peak luminance value for each material.


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