The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2014

Filed:

Nov. 29, 2013
Applicant:

Renesas Electronics Corporation, Kawasaki-shi, JP;

Inventors:

Makoto Okada, Kawasaki, JP;

Shuuichi Kariyazaki, Kawasaki, JP;

Wataru Shiroi, Kawasaki, JP;

Masafumi Suzuhara, Kawasaki, JP;

Naoko Sera, Kawasaki, JP;

Assignee:

Renesas Electronics Corporation, Kawasaki-Shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/34 (2006.01); H01L 23/02 (2006.01); H01L 23/498 (2006.01); H01L 23/28 (2006.01); H01L 25/065 (2006.01);
U.S. Cl.
CPC ...
H01L 23/02 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/16152 (2013.01); H01L 2224/16225 (2013.01); H01L 25/0655 (2013.01); H01L 23/498 (2013.01); H01L 2224/73253 (2013.01); H01L 2924/16251 (2013.01); H01L 2924/19041 (2013.01); H01L 2924/19043 (2013.01); H01L 2924/19105 (2013.01); H01L 2224/32225 (2013.01); H01L 2224/32245 (2013.01); H01L 23/28 (2013.01); H01L 2924/19106 (2013.01); H01L 2924/167 (2013.01); H01L 2224/92125 (2013.01); H01L 2224/73204 (2013.01); H01L 2924/3511 (2013.01);
Abstract

A semiconductor device in which warpage is less likely to occur. In the semiconductor device, two semiconductor chips are mounted over a diagonal of a substrate and one of the semiconductor chips lies over the intersection of the two diagonals of the substrate. The semiconductor device gives a solution to the following problem. In order to implement a semiconductor device with a plurality of semiconductor chips mounted on a substrate, generally the substrate must have a larger area. If the area of the substrate is increased without an increase in its thickness, warpage or deformation of the semiconductor device is more likely to occur. It is difficult or impossible to mount a warped or deformed semiconductor device over a wiring substrate.


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