The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Apr. 04, 2009
Helmut Lippert, Jena, DE;
Christopher Power, Jena, DE;
Christian Dietrich, Jena, DE;
Benno Radt, Jena, DE;
Helmut Lippert, Jena, DE;
Christopher Power, Jena, DE;
Christian Dietrich, Jena, DE;
Benno Radt, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A microscopy device, particularly for use in an imaging fluorescence lifetime microscopy method is provided. The microscopy device comprises an illumination means for generating an illumination beam, an imaging detector for spatially resolved acquisition of an emission radiation emitted by an object to be examined, an illumination beam path between the illumination means and the object to be examined, and a detection beam path between the object to be examined and the detector. The illumination beam path comprises illumination optics which are designed to generate a light sheet of illumination radiation extending transverse to the axis of the illumination beam path, wherein the axis of the detection beam path is oriented substantially perpendicular to a section plane of the light sheet and of the object to be examined. The illumination means comprise a pulsed laser.