The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Aug. 02, 2011
Jin Kang, Ellicott City, MD (US);
Marcin Arkadiusz Balicki, Baltimore, MD (US);
Xuan Liu, Baltimore, MD (US);
Jin Kang, Ellicott City, MD (US);
Marcin Arkadiusz Balicki, Baltimore, MD (US);
Xuan Liu, Baltimore, MD (US);
The Johns Hopkins University, Baltimore, MD (US);
Abstract
A method for calibrating a Fourier domain optical coherence tomography system includes receiving spectral data from an optical detector comprising a linear array of detector elements, each detector element having a position labeled n, wherein detected light was wavelength-dispersed across the linear array of detector elements; determining parameters of a preselected functional relationship between wave number, kn, corresponding to detector element n as a function of optical detector element n based on the spectral data; further receiving subsequent spectral data subsequent to the first-mentioned receiving, wherein detected light was wavelength-dispersed across the linear array of detector elements; converting the subsequent spectral data using the preselected functional relationship between wave number kn and optical detector element n to obtain converted spectral data; and performing an inverse Fourier transform of the converted spectral data to obtain a depth profile.