The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2014

Filed:

Jul. 08, 2013
Applicant:

Semileds Optoelectronics Co., Ltd., Chu-nan, TW;

Inventors:

Chen-Fu Chu, Hsinchu, TW;

Hao-Chung Cheng, Zhubei, TW;

Trung Tri Doan, Baoshan Township, TW;

Feng-Hsu Fan, Jhonghe, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/784 (2006.01); H01L 33/00 (2010.01); H01L 21/782 (2006.01); H01L 33/44 (2010.01); H01L 33/46 (2010.01);
U.S. Cl.
CPC ...
H01L 21/782 (2013.01); H01L 33/0095 (2013.01); H01L 33/44 (2013.01); H01L 33/0079 (2013.01); H01L 33/46 (2013.01);
Abstract

A method for fabricating semiconductor dice includes the steps of providing a wafer assembly having a substrate and semiconductor structures on the substrate; and defining the semiconductor dice on the substrate. The method also includes the step of separating the substrate from the semiconductor structures by applying a first laser pulse to each semiconductor die on the substrate having first parameters selected to break an interface between the substrate and the semiconductor structures and then applying a second laser pulse to each semiconductor die on the substrate having second parameters selected to complete separation of the substrate from the semiconductor structures. The method can also include the steps of forming one or more intermediate structures between the semiconductor dice on the substrate configured to protect the semiconductor dice during the separating step.


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