The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Feb. 19, 2013
Sintai Optical (Shenzhen) Co., Ltd., Shenzhen, CN;
Asia Optical International Ltd., Tortola, GB;
Yen-Chao Chen, Taichung, TW;
Chih-Hsien Lin, Taichung, TW;
Tsung-Wei Lin, Taichung, TW;
Szu-Han Wu, Taichung, TW;
Jen-Chih Chung, Taichung, TW;
Yung-Sheng Chiang, Taichung, TW;
Sintai Optical (Shenzhen) Co., Ltd., Shenzhen, Guandong Province, CN;
Asia Optical International Ltd., Tortola, VG;
Abstract
A sight and methods of operation thereof are provided. In some embodiments, an image is captured via an image capture unit, and a center position is calculated according to the positions of at least three impact points in the image, and a predefined view center of a display unit is set to the center position. In some embodiments, an angle of dip of the sight to a plane is detected via a dip angle detector. A predictive impact point is calculated according to the angle of dip and at least one calculation parameter, and an impact point indication is accordingly displayed in the display unit. When the angle of dip is changed, the predictive impact point is recalculated according to the new angle of dip, and the corresponding impact point indication is displayed.