The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Dec. 18, 2012
Advantest Corporation, Tokyo, JP;
Masao Fujino, Miyagi, JP;
Toshiaki Hayakawa, Miyagi, JP;
Advantest Corporation, Tokyo, JP;
Abstract
To measure contact pressure of each of a plurality of small protrusions arranged at a narrow pitch and contacting a flat surface, provided is a contact pressure detection apparatus comprising a sensor section that is contacted by a target and has pressure applied thereto by the target; a light source section that radiates light with a wavelength causing Raman scattering in the sensor section to which the pressure is applied; and a detecting section that receives light from the sensor section and detects the pressure between the sensor section and the target. Also provided is a contact point pressure measurement apparatus that measures contact pressure of an electrode of a device under test, comprising: a fixing section that has the device under test mounted thereon and fixes the electrode of the device under test in a manner to press against the sensor section; and the contact pressure detection apparatus.