The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

May. 17, 2011
Applicant:

Emil I. Gizdarski, Cupertino, CA (US);

Inventor:

Emil I. Gizdarski, Cupertino, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G11C 19/00 (2006.01); G01R 31/3185 (2006.01); G01R 31/3183 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318547 (2013.01); G01R 31/318335 (2013.01); G01R 31/318544 (2013.01);
Abstract

Methods and apparatuses are described for decompressing and routing test data. Some embodiments feature an integrated circuit (IC) that includes two or more shift registers configured to shift in the test data. Each of the two or more shift registers can include two or more sequential elements configured such that a scan chain in the set of scan chains receives inputs from at most one sequential element in each of the two or more shift registers. At least one shift register in the two or more shift registers can be configured as a circular shift register. The IC can also include a logic network coupled between the two or more shift registers and the set of scan chains such that the set of scan chains receives the decompressed test data from the two or more shift registers via the logic network.


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