The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Sep. 14, 2012
Erik Jan Marinissen, Leuven, BE;
Sergej Deutsch, Durham, NC (US);
Erik Jan Marinissen, Leuven, BE;
Sergej Deutsch, Durham, NC (US);
Cadence Design Systems, Inc., San Jose, CA (US);
IMEC, Leuven, BE;
Abstract
A method is provided to test a modular integrated circuit (IC) comprising: testing a module-under-test (MUT) within the IC while causing a controlled toggle rate within a first neighbor module of the MUT; wherein the controlled toggle rate within the first neighbor module is selected so that toggling within the first neighbor module has substantially the same effect upon operation of the MUT that operation of the first neighbor module would have during actual normal functional operation of the first neighbor module.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile