The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Jun. 30, 2009
Applicants:

Mark A. Yarch, Chandler, AZ (US);

Pankaj Kumar, Chandler, AZ (US);

Hang T. Nguyen, Tempe, AZ (US);

Inventors:

Mark A. Yarch, Chandler, AZ (US);

Pankaj Kumar, Chandler, AZ (US);

Hang T. Nguyen, Tempe, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/08 (2006.01); G06F 11/16 (2006.01); G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1666 (2013.01); G06F 11/20 (2013.01); G06F 2201/82 (2013.01);
Abstract

Methods and apparatus relating to processing out of order transactions for mirrored subsystems. A first device (that is mirroring data from a second device) includes a cache to track out of order write operations prior to writing data from the write operations to memory. A register may be used to track the state of the cache in response to receipt of a special transaction, which may be a posted transaction or snapshot. The first devise transmits an acknowledgement of commitment of the data to memory once all cache entries, as recorded at a select point by the register, are emptied or otherwise invalidated. Devices may communicate via a peripheral component interconnect express (PCIe) interconnect, and may include a point-to-point or serial link. Various components may be on the same integrated circuit die. An uninterrupted power supply or batteries may supply power in response to a power failure.


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