The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2014
Filed:
May. 03, 2012
William Mcmahon, Scarsdale, NY (US);
Richard Francis, Sunnyvale, CA (US);
Randy W. Mann, Milton, NY (US);
William McMahon, Scarsdale, NY (US);
Richard Francis, Sunnyvale, CA (US);
Randy W. Mann, Milton, NY (US);
GLOBALFOUNDRIES Inc., Grand Cayman, KY;
Abstract
An integrated circuit device includes at least one test device and a stress generator coupled to the test device and operable to cycle the at least one test device to generate an AC stress. A method for testing an integrated circuit device including at least one test device and a stress generator coupled to the test device includes enabling the stress generator to cycle the at least one test device to generate an AC stress and measuring at least one parameter of the test device to determine an effect of the AC stress.