The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Sep. 08, 2011
Applicants:

Sylvain Pharand, Bromont, CA;

Rejean Paul Levesque, Bromont, CA;

Isabelle Paquin, Bromont, CA;

Denis Plouffe, Bromont, CA;

Matthieu Lirette-gelinas, Bromont, CA;

Inventors:

Sylvain Pharand, Bromont, CA;

Rejean Paul Levesque, Bromont, CA;

Isabelle Paquin, Bromont, CA;

Denis Plouffe, Bromont, CA;

Matthieu Lirette-Gelinas, Bromont, CA;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); B07C 5/342 (2006.01);
U.S. Cl.
CPC ...
B07C 5/342 (2013.01);
Abstract

A method of sorting laminates includes characterizing first shapes of laminates from measurements taken of each, assembling the laminates to derive a first relationship between the first shapes and yield loss, characterizing second shapes of the laminates from a reduced number of the measurements to derive a second relationship between the second shapes and yield loss, analyzing a change in the derived relationships to determine a least number of the measurements necessary for achieving the yield loss and sorting supplied laminates in accordance with a characterized shape of each, which is obtained from the least number of the measurements taken for each supplied laminate.


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