The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2014
Filed:
Sep. 26, 2013
Applicant:
Avaya Inc., Basking Ridge, NJ (US);
Inventors:
Joann J. Ordille, Lebanon, NJ (US);
Valentine C. Matula, Granville, OH (US);
Ramanujan Kashi, Thalaghattapura, IN;
Assignee:
Avaya Inc., Basking Ridge, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M 3/00 (2006.01); H04M 5/00 (2006.01); H04M 3/523 (2006.01);
U.S. Cl.
CPC ...
H04M 3/523 (2013.01);
Abstract
External queue monitoring of contact center queues is provided as a means that may better service the customer and measure service level objectives. External queue monitoring provides the opportunity for real-time monitoring of the queue and modification of contact center operations, such as devices routing queue members, in response to queuing or enqueued customers.
Ordille, Joann. (2014). External contact center data collection and measurement (U.S. Patent No. 8903076). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8903076
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile