The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Jan. 30, 2012
Applicants:

Sigematsu Asano, Tokyo, JP;

Ichiro Tobita, Tokyo, JP;

Atsushi Ohbuchi, Tokyo, JP;

Takayuki Konya, Tokyo, JP;

Inventors:

Sigematsu Asano, Tokyo, JP;

Ichiro Tobita, Tokyo, JP;

Atsushi Ohbuchi, Tokyo, JP;

Takayuki Konya, Tokyo, JP;

Assignee:

Rigaku Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2006.01); G01N 23/207 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20008 (2013.01); G01N 23/207 (2013.01); G01N 2223/32 (2013.01); G01N 2223/316 (2013.01);
Abstract

An X-ray shielding member is provided so as to confront an X-ray incident face of a sample, and a gap through which an X-ray emitted from an X-ray source is passed and irradiated to an X-ray incident face of the sample is formed between the X-ray shielding member and the X-ray incident face of the sample. A gap adjusting mechanism for moving the X-ray shielding member is further provided to move the X-ray shielding member in accordance with change of an X-ray incident angle to the sample by a goniometer, whereby the breadth of the gap formed between the X-ray shielding member and the X-ray incident face of the sample can be adjusted.


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