The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Apr. 20, 2012
Applicants:

Ying-yen Chen, Chia Yi County, TW;

Jih-nung Lee, Hsin Chu County, TW;

Chun-yu Yang, Chia Yi, TW;

Inventors:

Ying-Yen Chen, Chia Yi County, TW;

Jih-Nung Lee, Hsin Chu County, TW;

Chun-Yu Yang, Chia Yi, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/14 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2884 (2013.01);
Abstract

An element measurement circuit is provided, comprising a oscillator for generating a first oscillation clock and second oscillation clock, a frequency divider for dividing the first oscillation clock to generate a third oscillation clock and for dividing the second oscillation clock to generate a fourth oscillation clock, a frequency detector for detecting the third oscillation clock to generate a first count value and for detecting the fourth oscillation clock to generate a second count value, and a controller for generating a first oscillation period according to the first count value, for generating a second oscillation period according to the second count value, and for generating a measurement value according to the first oscillation period and the second oscillation period.


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