The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Dec. 14, 2010
Applicants:

Akira Hosomi, Tokyo, JP;

Kensuke Ohmae, Tokyo, JP;

Inventors:

Akira Hosomi, Tokyo, JP;

Kensuke Ohmae, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C09K 13/00 (2006.01); H01L 23/00 (2006.01); C23F 1/02 (2006.01); C23F 1/18 (2006.01); H01L 21/3213 (2006.01); H01L 23/31 (2006.01); H01L 23/525 (2006.01);
U.S. Cl.
CPC ...
H01L 21/32134 (2013.01); H01L 2924/01013 (2013.01); H01L 2224/13144 (2013.01); H01L 2924/01005 (2013.01); H01L 2224/13007 (2013.01); H01L 2924/01019 (2013.01); H01L 2924/01033 (2013.01); H01L 2224/1147 (2013.01); H01L 2224/02311 (2013.01); H01L 2224/03914 (2013.01); H01L 2224/03614 (2013.01); H01L 2924/01029 (2013.01); H01L 2224/13147 (2013.01); H01L 2224/13083 (2013.01); H01L 2924/01004 (2013.01); H01L 2224/13082 (2013.01); H01L 2224/05548 (2013.01); H01L 2224/131 (2013.01); H01L 2224/0347 (2013.01); H01L 2224/03462 (2013.01); H01L 2924/00013 (2013.01); H01L 24/11 (2013.01); H01L 2224/05124 (2013.01); C23F 1/02 (2013.01); H01L 2224/02331 (2013.01); H01L 2224/05027 (2013.01); H01L 2224/05008 (2013.01); H01L 2924/01079 (2013.01); H01L 2224/05166 (2013.01); H01L 23/3114 (2013.01); H01L 2924/014 (2013.01); H01L 2224/11912 (2013.01); H01L 2224/11462 (2013.01); C23F 1/18 (2013.01); H01L 24/05 (2013.01); H01L 2224/11334 (2013.01); H01L 24/03 (2013.01); H01L 2924/01006 (2013.01); H01L 2224/13155 (2013.01); H01L 2924/01082 (2013.01); H01L 24/13 (2013.01); H01L 2924/01074 (2013.01); H01L 2224/1191 (2013.01); H01L 2224/05647 (2013.01); H01L 23/525 (2013.01); H01L 2224/02313 (2013.01); H01L 2924/01075 (2013.01); H01L 224/05144 (2013.01); H01L 2224/05147 (2013.01); H01L 2224/05572 (2013.01); H01L 2224/03916 (2013.01); H01L 2224/0239 (2013.01);
Abstract

Disclosed are an etchant which is used for redistribution of a semiconductor substrate having an electrode and which is capable of selectively etching copper without etching nickel; and a method for manufacturing a semiconductor device using the same. Specifically disclosed are an etchant which is used for redistribution of a semiconductor substrate and which contains hydrogen peroxide and citric acid and has a content of hydrogen peroxide of from 0.75 to 12% by mass and a content of citric acid of from 1 to 20% by mass, with a molar ratio of hydrogen peroxide and citric acid being in the range of from 0.3 to 5; an etchant for selective etching of copper which is used for redistribution of a semiconductor substrate and which contains hydrogen peroxide and malic acid and has a content of hydrogen peroxide of from 0.75 to 12% by mass and a content of malic acid of from 1.5 to 25% by mass, with a molar ratio of hydrogen peroxide and malic acid being in the range of from 0.2 to 6; and a method for manufacturing a semiconductor device using such an etchant.


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