The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2014

Filed:

Nov. 13, 2012
Applicant:

Qualcomm Technologies, Inc., San Diego, CA (US);

Inventor:

Meir Tzur, Haifa, IL;

Assignee:

QUALCOMM Technologies, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 5/228 (2006.01); B60Q 1/00 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
H04N 5/225 (2013.01);
Abstract

Embodiments are directed towards performing depth estimation within a digital camera system based on interpolation of inverse focus statistics. After an image is captured, various statistics or focus measure may be calculated using, for example, a high pass filter. Depth is estimated by interpolating the inverse of the statistics for three positions of focus for the image. The inverse of the statistics, St(n), may be 1/St(n), or 1/St(n), or even 1/St(n), where Z≧1. Several approaches to interpolating the inverse values of the statistics to obtain a depth estimate are disclosed, including a general parabolic minimum approach, using a parabolic minimum within a progressive scheme, or within a continuous AF scheme. The depth estimate may then be used for a variety of applications, including automatic focusing, as well as converting 2D images to 3D images.


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