The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2014

Filed:

Feb. 18, 2011
Applicants:

Naonori Akae, Toyama, JP;

Kotaro Murakami, Toyama, JP;

Yoshiro Hirose, Toyama, JP;

Kenji Kameda, Toyama, JP;

Inventors:

Naonori Akae, Toyama, JP;

Kotaro Murakami, Toyama, JP;

Yoshiro Hirose, Toyama, JP;

Kenji Kameda, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 16/34 (2006.01); C23C 16/40 (2006.01); B08B 5/00 (2006.01); H01L 21/31 (2006.01); C23C 16/00 (2006.01); C23C 16/44 (2006.01); C23C 16/30 (2006.01); C23C 16/455 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
C23C 16/4405 (2013.01); C23C 16/30 (2013.01); C23C 16/345 (2013.01); C23C 16/347 (2013.01); C23C 16/402 (2013.01); C23C 16/45531 (2013.01); H01L 21/02126 (2013.01); H01L 21/0228 (2013.01); Y10S 438/905 (2013.01);
Abstract

To provide a method of manufacturing a semiconductor device, including: forming a thin film different from a silicon oxide film on a substrate by supplying a processing gas into a processing vessel in which the substrate is housed; removing a deposit including the thin film adhered to an inside of the processing vessel by supplying a fluorine-containing gas into the processing vessel after executing forming the thin film prescribed number of times; and forming a silicon oxide film having a prescribed film thickness on the inside of the processing vessel by alternately supplying a silicon-containing gas, and an oxygen-containing gas and a hydrogen-containing gas into the heated processing vessel in which a pressure is set to be less than an atmospheric pressure after removing the deposit.


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