The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Dec. 15, 2009
Applicants:

Jaeyeon Jung, Kirkland, WA (US);

Yu Zhu, Berkeley, CA (US);

Inventors:

Jaeyeon Jung, Kirkland, WA (US);

Yu Zhu, Berkeley, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01);
U.S. Cl.
CPC ...
Abstract

A system and method for tracking sensitive data uses dynamic taint analysis to track sensitive data as the data flows through a target application running on a computer system. In general, the system and method for tracking sensitive data marks data as tainted when the data input to the target application is indicated as sensitive. The system and method may then track the propagation of the tainted data as the data is read from and written to memory by the target application to detect if the tainted data is output from the application (e.g., leaked). Dynamic binary translation may be used to provide binary instrumentation of the target application for dynamic taint analysis to track propagation of the tainted data at the instruction level and/or the function level. Of course, many alternatives, variations, and modifications are possible without departing from this embodiment.


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