The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Feb. 07, 2013
Applicant:

Oclaro Japan, Inc., Kanagawa, JP;

Inventors:

Kouji Nakahara, Tokyo, JP;

Yuki Wakayama, Tokyo, JP;

Takeshi Kitatani, Tokyo, JP;

Kazunori Shinoda, Tokyo, JP;

Assignee:

Oclaro Japan, Inc., Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 5/00 (2006.01); H01S 5/227 (2006.01); H01S 5/34 (2006.01); H01S 5/22 (2006.01); H01S 5/32 (2006.01); H01S 5/343 (2006.01); H01S 5/30 (2006.01); H01S 5/028 (2006.01); H01S 5/20 (2006.01); H01S 5/12 (2006.01);
U.S. Cl.
CPC ...
H01S 5/3403 (2013.01); H01S 5/2222 (2013.01); H01S 5/3201 (2013.01); H01S 5/34306 (2013.01); H01S 5/2275 (2013.01); H01S 5/0021 (2013.01); H01S 5/3095 (2013.01); H01S 5/2226 (2013.01); H01S 5/2224 (2013.01); H01S 5/0287 (2013.01); H01S 5/3213 (2013.01); H01S 5/2213 (2013.01); H01S 2301/176 (2013.01); H01S 5/209 (2013.01); H01S 5/12 (2013.01); H01S 5/2201 (2013.01); H01S 5/2206 (2013.01);
Abstract

In a BH laser which uses InGaAlAs-MQW in an active layer, Al-based semiconductor multi-layer films including an InP buffer layer and an InGaAlAs-MQW layer, and an InGaAsP etching stop layer are formed in a mesa shape, and a p type InP burial layer is buried in side walls of the mesa shape. An air ridge mesa-stripe of a lateral center that is substantially the same as that of the mesa shape is formed on the mesa shape. According to the present structure, a leakage current can be considerably reduced, the light confinement coefficient can be made to be larger than in a BH laser in the related art, and thereby it is possible to implement a semiconductor laser with a low leakage current and a high relaxation oscillation frequency.


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