The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Apr. 23, 2008
Fabien Jammes, Cuvat, FR;
Bruno Flament, Sant Julien de Ratz, FR;
Pierre-brice Wieber, Grenoble, FR;
Fabien Jammes, Cuvat, FR;
Bruno Flament, Sant Julien de Ratz, FR;
Pierre-Brice Wieber, Grenoble, FR;
Commissariat a l'Energie Atomique, Paris, FR;
Inria Institut National de Recherche en Informatique et en Automatique, Le Chesnay, FR;
Abstract
A method of obtaining simulated parameters (,,,) able to characterize the movement of an articulated structure provided with sensors, characterized in that the method comprises the following steps: calculating, from estimated movement state parameters of the structure, estimated measurement data (,), each estimated measurement data item corresponding to a measurement delivered by a sensor, difference between the measurements delivered by the sensors and the estimated measurement data that correspond to them, global mathematical processing of the observer type of the data issuing from the difference in order to obtain at least one estimated difference for an estimated movement state parameter, and adding the estimated difference for the estimated movement state parameter and the estimated movement state parameter that corresponds to it in order to form a simulated parameter.