The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Apr. 10, 2012
Yoba Amoah, Fairfax, VT (US);
John J. Ellis-monaghan, Grand Isle, VT (US);
Roger C. Kuo, South Burlington, VT (US);
Molly J. Leitch, Nashville, TN (US);
Zhihong Zhang, Chandler, AZ (US);
Yoba Amoah, Fairfax, VT (US);
John J. Ellis-Monaghan, Grand Isle, VT (US);
Roger C. Kuo, South Burlington, VT (US);
Molly J. Leitch, Nashville, TN (US);
Zhihong Zhang, Chandler, AZ (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of testing a semiconductor wafer and a related structure. In various embodiments, a method includes: placing a probe on a first chip on the semiconductor wafer; testing a scribe line automatic built-in self-test (ABIST) for the first chip to search for a fault; progressively testing a subsequent scribe line ABIST for a subsequent chip on the semiconductor wafer in response to determining the ABIST for the first chip does not indicate the fault; moving the probe point to the subsequent chip and retesting the subsequent scribe line ABIST in response to determining the ABIST for the subsequent chip indicates a fault; and testing a further subsequent scribe line ABIST for a further subsequent chip on the semiconductor wafer in response to determining the retesting of the subsequent scribiline ABIST does not indicate a fault in the subsequent scribe line ABIST.