The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

May. 19, 2010
Applicants:

Kathryn A. Engholm, Portland, OR (US);

Soraya J. Matos, Beaverton, OR (US);

Shigetsune Torin, Beaverton, OR (US);

Inventors:

Kathryn A. Engholm, Portland, OR (US);

Soraya J. Matos, Beaverton, OR (US);

Shigetsune Torin, Beaverton, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/02 (2006.01); G01R 19/00 (2006.01); G01R 31/28 (2006.01); G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2837 (2013.01); G01R 27/28 (2013.01);
Abstract

A method of measuring the phase transient response of a device under test automatically provides a flattened phase transient response without any user intervention. The method comprises the steps of calculating an instantaneous phase waveform based on an instantaneous voltage waveform that represents an output signal of the device under test as it steps from a first frequency to a second frequency, calculating an instantaneous frequency waveform based on the instantaneous phase waveform, automatically estimating the second frequency based on the instantaneous frequency waveform without any user intervention, and flattening the instantaneous phase waveform based on the estimate of the second frequency.


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