The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Jul. 26, 2011
Seiji Yaegashi, Tokyo, JP;
Makoto Kiyama, Itami, JP;
Mitsunori Yokoyama, Tokyo, JP;
Kazutaka Inoue, Yokohama, JP;
Masaya Okada, Osaka, JP;
Yu Saitoh, Itami, JP;
Seiji Yaegashi, Tokyo, JP;
Makoto Kiyama, Itami, JP;
Mitsunori Yokoyama, Tokyo, JP;
Kazutaka Inoue, Yokohama, JP;
Masaya Okada, Osaka, JP;
Yu Saitoh, Itami, JP;
Sumitomo Electric Industries, Ltd., Osaka-shi, JP;
Abstract
In a vertical semiconductor device including a channel in an opening, a semiconductor device whose high-frequency characteristics can be improved and a method for producing the semiconductor device are provided. The semiconductor device includes n-type GaN-based drift layer/p-type GaN-based barrier layer/n-type GaN-based contact layer. An openingextends from a top layer and reaches the n-type GaN-based drift layer. The semiconductor device includes a regrown layerlocated so as to cover the opening, the regrown layerincluding an electron drift layerand an electron supply layer, a source electrode S, a drain electrode D, and a gate electrode G located on the regrown layer. Assuming that the source electrode serving as one electrode and the drain electrode serving as the other electrode constitute a capacitor, the semiconductor device includes a capacitance-decreasing structure that decreases the capacitance of the capacitor.