The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Mar. 04, 2013
Applicant:
Frito-lay North America, Inc., Plano, TX (US);
Inventors:
Wilfred M. Bourg, Jr., Melissa, TX (US);
Scott Fagan, Dallas, TX (US);
Assignee:
Frito-Lay North America, Inc., Plano, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/62 (2006.01); G12B 13/00 (2006.01); G01N 5/02 (2006.01); G01N 33/00 (2006.01); G01N 15/02 (2006.01); G01N 25/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/00 (2013.01); G01N 15/0205 (2013.01); G01N 25/00 (2013.01);
Abstract
A method for analyzing moisture content in an analyzer. In one embodiment a sample is introduced into an analyzer and an initial weight is obtained. The sample is then fortified where it is allowed to pick-up moisture. The temperature of the analyzer is increased and an initial fortified point is obtained wherein the sample has returned to its initial weight. Thereafter the analyzer obtains the final moisture content of the sample at a test finish time. In one embodiment satellite analyzers are biased against a standard analyzer so that more uniform results are obtained.