The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Dec. 05, 2012
Applicant:
Nhn Corporation, Seongnam-si, KR;
Inventors:
Jowon Yi, Seongnam-si, KR;
Sung Tak Cho, Seongnam-si, KR;
Joon-kee Chang, Seongnam-si, KR;
Rockyou Park, Seongnam-si, KR;
Young Dong Jung, Seongnam-si, KR;
Yeontae Kim, Seongnam-si, KR;
Assignee:
NHN Corporation, Seongnam-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/66 (2006.01); G06T 5/00 (2006.01); G06K 9/46 (2006.01); G06T 5/40 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4642 (2013.01); G06T 5/00 (2013.01); G06T 2207/10004 (2013.01); G06T 5/009 (2013.01); G06T 5/40 (2013.01);
Abstract
Provided is a composition-based exposure measuring method and apparatus for measuring an exposure degree of an object included in an image, including: receiving an input of the image; measuring an exposure amount of a pixel located in a region determined based on a composition, among pixels of the received image; and determining the exposure degree of the object based on the measured exposure amount.