The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Mar. 04, 2011
Applicant:
Shin Masuda, Miyagi, JP;
Inventor:
Shin Masuda, Miyagi, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01R 31/28 (2006.01); G01R 15/22 (2006.01); G02B 6/42 (2006.01); G01R 31/311 (2006.01); G01J 1/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2886 (2013.01); G01R 15/22 (2013.01); G02B 6/4206 (2013.01); G01R 31/311 (2013.01); G01J 1/28 (2013.01);
Abstract
Provided is a test apparatus that tests a device under test including an optical coupler transmitting optical signals in a direction perpendicular to a device surface. The test apparatus includes a substrate on which the device under test is to be loaded, an optical transmission path that transmits the optical signals, and a lens section facing the optical coupler on the substrate that focuses the optical signals from an end of either the optical coupler or the optical transmission path to an end of the other.