The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2014

Filed:

Dec. 17, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Charles Jay Alpert, Austin, TX (US);

Glenn R. Bee, Elgin, TX (US);

Zhuo Li, Cedar Park, TX (US);

Tuhin Mahmud, Austin, TX (US);

Stephen T. Quay, Austin, TX (US);

Lakshmi N. Reddy, Briarcliff Manor, NY (US);

Chin Ngai Sze, Austin, TX (US);

Yaoguang Wei, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5068 (2013.01);
Abstract

A system, process, etc. according to some embodiments, which includes operations that include selecting one of a plurality of solutions ('selected solution') for optimization of an integrated circuit design during physical synthesis. The operations can further include performing on the selected solution a fast evaluation of a specific metric without updating design documents (e.g., without updating a netlist or metric map). If the evaluation of the specific metric is non-satisfactory, then the candidate solution is rejected. If the evaluation of the specific metric is satisfactory, then a design document is updated and a full evaluation of the specific metric (and other metrics) can be performed.


Find Patent Forward Citations

Loading…