The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2014

Filed:

May. 12, 2011
Applicants:

Guhan Krishnan, Chelmsford, MA (US);

Jonathan M. Owen, Northborough, MA (US);

Brian Amick, Bedford, MA (US);

Hanwoo Cho, Acton, MA (US);

Inventors:

Guhan Krishnan, Chelmsford, MA (US);

Jonathan M. Owen, Northborough, MA (US);

Brian Amick, Bedford, MA (US);

Hanwoo Cho, Acton, MA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 13/16 (2006.01);
U.S. Cl.
CPC ...
G06F 13/1663 (2013.01); G06F 13/1689 (2013.01);
Abstract

A method and apparatus for training read latency of a memory are disclosed. A memory controller includes a command FIFO configured to convey commands to a memory, a data queue coupled to receive data from the memory, and a register configured to provide a value indicative of a number of cycles of a first clock signal after which data is valid. During a startup routine, the memory controller is configured to compare data received by the data queue to a known data pattern after a specified number of cycles of the first clock signal have elapsed. The memory controller is further to configured to decrement the first value and repeat conveying and comparing if the data received matches the data pattern. If the received data does not match the data pattern for any attempted read of the memory, the memory controller is configured to program a second value into the register.


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