The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2014
Filed:
May. 07, 2013
Qualcomm Technologies, Inc., San Diego, CA (US);
Christophe Bernard, London, GB;
Sarah Lannes, Orsay, FR;
Qualcomm Technologies, Inc., San Diego, CA (US);
Abstract
A method for determining noise levels in a subband of an image. The method comprises receiving the subband of the image, defining block regions in at least two space domains of the subband, for each defined block region, identifying first wavelet coefficients associated with coordinate values in the at least two space domains in the defined block region, computing a correlation matrix between identified wavelet coefficients to determine the correlation between first wavelet coefficients according to the at least one color domain, computing second wavelet coefficients, the computation of second wavelet coefficients being based on the correlation matrix and the first wavelet coefficients, computing at least one noise level, the noise level computation being based on at least one second wavelet coefficient and providing the at least one noise level.