The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2014
Filed:
Mar. 07, 2012
Applicants:
Nils Langholz, Apolda, DE;
Dieter Huhse, Berlin, DE;
Inventors:
Nils Langholz, Apolda, DE;
Dieter Huhse, Berlin, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01N 21/64 (2006.01); G06T 5/50 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/008 (2013.01); G01N 21/6458 (2013.01); G06T 2207/10144 (2013.01); G06T 5/50 (2013.01); G06T 2207/20216 (2013.01); G06T 2207/20208 (2013.01); G06T 2207/10061 (2013.01); G02B 21/0076 (2013.01);
Abstract
Laser scanning microscope and method for the operation thereof having at least two detection channels which has at least one beamsplitter with a splitting of the sample light deviating from the 50:50 split and/or, with 50:50 split in the detection channels, has detectors with differently adjusted gain, or in at least one detection channel with equal light splitting has an additional light attenuator.