The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2014
Filed:
May. 26, 2010
Ho Kim, Seoul, KR;
Kwang-ill Kho, Seoul, KR;
Hee-wook You, Anyang-si, KR;
Jae-myeong Song, Seongnam-si, KR;
Ho Kim, Seoul, KR;
Kwang-Ill Kho, Seoul, KR;
Hee-Wook You, Anyang-si, KR;
Jae-Myeong Song, Seongnam-si, KR;
Koh Young Technology Inc., Seoul, KR;
Abstract
A three dimensional shape measurement apparatus includes m projecting sections, each of which includes a light source and a grating element, and, while moving the grating element by n times, projects a grating pattern light onto a measurement target for each movement, wherein the 'n' and the 'm' are natural numbers greater than or equal to 2, an imaging section photographing a grating pattern image reflected by the measurement target, and a control section controlling that, while photographing the grating pattern image by using one of the m projecting sections, a grating element of at least another projecting section is moved. Thus, measurement time may be reduced.