The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2014

Filed:

Sep. 08, 2011
Applicants:

Raied N. Mazahreh, Cottonwood Heights, UT (US);

Hai-jo Tarn, San Jose, CA (US);

Inventors:

Raied N. Mazahreh, Cottonwood Heights, UT (US);

Hai-Jo Tarn, San Jose, CA (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/15 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1545 (2013.01); H03M 13/1575 (2013.01); H03M 13/1525 (2013.01); H03M 13/157 (2013.01); H03M 13/151 (2013.01);
Abstract

In one embodiment, a Chien search circuit includes a plurality of evaluation circuits, each configured to sequentially evaluate possible roots αin a respective subset of possible roots of an error location polynomial (Λ(x)). Each evaluation circuit includes a respective sub-circuit for each of a plurality of coefficients λ(0≦i≦T) of the error location polynomial Λ(x) having T+1 coefficients. Each sub-circuit is configured to calculate one term of the error location polynomial for each possible root αin the respective subset of possible roots. Each evaluation circuit is configured to evaluate the error location polynomial for each possible root in the respective subset of possible roots, as a sum of the terms calculated by the plurality of sub-circuits.


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