The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
May. 21, 2008
Timothy W. Stippick, Phoenix, AZ (US);
Thomas B. Blank, Gilbert, AZ (US);
Timothy L. Ruchti, Gurnee, IL (US);
Christopher Slawinski, Mesa, AZ (US);
Timothy W. Stippick, Phoenix, AZ (US);
Thomas B. Blank, Gilbert, AZ (US);
Timothy L. Ruchti, Gurnee, IL (US);
Christopher Slawinski, Mesa, AZ (US);
GLT Acquisition Corp., Irvine, CA (US);
Abstract
The invention relates generally to a probe interface method and apparatus for use in conjunction with an optical based noninvasive analyzer. More particularly, an algorithm controls a sample probe position and attitude relative to a skin sample site before and/or during sampling. For example, a sample probe head of a sample module is controlled by an algorithm along the normal-to-skin-axis. Preferably, the sample probe head is positioned in terms of 3-D location in the x-, y-, and z-axes and is attitude orientated in terms of pitch, yaw, and roll. Further, attitude of the probe head is preferably orientated prior to contact of the sample probe head with the tissue sample using indicators, such as non-contact distance feedback from capacitance sensor, contacting or non-contacting optical sensors, and/or contact electrical sensors.