The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2014

Filed:

Feb. 09, 2010
Applicants:

Katsuhiro Kanda, Hitachinaka, JP;

Makoto Nogami, Tsuchiura, JP;

Izumi Waki, Tokyo, JP;

Inventors:

Katsuhiro Kanda, Hitachinaka, JP;

Makoto Nogami, Tsuchiura, JP;

Izumi Waki, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01); G01N 31/00 (2006.01); G01N 33/68 (2006.01);
U.S. Cl.
CPC ...
G01N 33/6848 (2013.01);
Abstract

An immunoanalytical system in which, after a sample such as a patient's serum is subjected to a pretreatment by an immunological pretreatment device, the sample is subjected to light detection by an immunological photometric detection system. Subsequently, the mass spectrometric pretreatment device performs a pretreatment, and the mass spectrometric detection system performs mass spectrometry. The mass spectrometric detection system performs mass spectrometry on components contained in a supernatant. A signal intensity and peak area for each of components are calculated from an obtained chromatograph. A quantitative value measured based on the immunoanalytical method is calculated for each of the components on the basis of the relative ratios of the components.


Find Patent Forward Citations

Loading…