The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Feb. 15, 2012
Yu Huang, Sudbury, MA (US);
Wu-tung Cheng, Lake Oswego, OR (US);
Ting-pu Tai, Taipei, TW;
Liyang Lai, Wilsonville, OR (US);
Ruifeng Guo, Portland, OR (US);
Yu Huang, Sudbury, MA (US);
Wu-Tung Cheng, Lake Oswego, OR (US);
Ting-Pu Tai, Taipei, TW;
Liyang Lai, Wilsonville, OR (US);
Ruifeng Guo, Portland, OR (US);
Mentor Graphics Corporation, Wilsonville, OR (US);
Abstract
Aspects of the invention relate to techniques for diagnosing compound hold-time faults. A profiling-based scan chain diagnosis may be performed on a faulty scan chain to determine observed scan cell failing probability information and one or more faulty segments based on scan pattern test information. Calculated scan cell failing probability information may then be derived. Based on the calculated scan cell failing probability information and the observed scan cell failing probability information, one or more validated faulty segments are verified to have one or more compound hold-time faults. Finally, one or more clock defect suspects may be identified based on information of the one or more validated faulty segments.