The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2014
Filed:
Jan. 17, 2012
Chorng-tyan Lin, Kaohsiung, TW;
Chih-chin Wen, Kaohsiung, TW;
Chun-ming Yang, Kaohsiung, TW;
Jwu-jiun Yang, Kaohsiung, TW;
Chorng-tyan Lin, Kaohsiung, TW;
Chih-chin Wen, Kaohsiung, TW;
Chun-ming Yang, Kaohsiung, TW;
Jwu-jiun Yang, Kaohsiung, TW;
Metal Industries Research & Development Centre, Kaohsiung, TW;
Abstract
An alignment method for assembling substrates in different spaces without fiducial mark and its system are provided, and the alignment method has steps of: pre-defining partially standard character regions of two substrates; capturing at least two partially actual images of two substrates in different waiting spaces, respectively; comparing to obtain at least two partially actual character regions of the two substrates, respectively; building actual coordinate systems of the two substrates, respectively; comparing the actual coordinate systems of the two substrates with each other to obtain a set of offset values; moving the two substrates from the different waiting spaces to an alignment-and-installation space based on the set of offset values and a predetermined movement value, respectively; and stacking the two substrates with each other to finish the alignment and installation in the alignment-and-installation space.