The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

May. 22, 2009
Applicants:

Trond Karsten Varslot, Bruce, AU;

Andrew Maurice Kingston, Griffith, AU;

Adrian Paul Sheppard, Canberra, AU;

Mark Alexander Knackstedt, Canberra, AU;

Robert Martin Sok, Canberra, AU;

Shane Jamie Latham, Canberra, AU;

Inventors:

Trond Karsten Varslot, Bruce, AU;

Andrew Maurice Kingston, Griffith, AU;

Adrian Paul Sheppard, Canberra, AU;

Mark Alexander Knackstedt, Canberra, AU;

Robert Martin Sok, Canberra, AU;

Shane Jamie Latham, Canberra, AU;

Assignee:

FEI Company, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0024 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/30108 (2013.01);
Abstract

A method for processing image data of a sample is disclosed. The method comprises registering a first and a second images of at least partially overlapping spatial regions of the sample and processing data from the registered images to obtain integrated image data comprising information about the sample, said information being additional to that available from said first and second images.


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