The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Oct. 28, 2011
Ramesh C. Tekumalla, Breinigsville, PA (US);
Ramesh C. Tekumalla, Breinigsville, PA (US);
LSI Corporation, San Jose, CA (US);
Abstract
An integrated circuit comprises scan test circuitry and additional circuitry subject to testing utilizing the scan test circuitry. The scan test circuitry comprises at least one scan chain having a plurality of scan cells. The scan test circuitry further comprises scan enable timing control circuitry coupled between a scan enable input of the scan test circuitry and scan enable inputs of respective ones of the scan cells. The scan enable timing control circuitry is operative to control timing of a transition between a scan shift configuration of the scan cells and a functional data capture configuration of the scan cells so as to permit testing of the scan cells in the scan shift configuration.