The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Sep. 07, 2011
Takeshi Sawa, Kawasaki, JP;
Eiji Furuta, Sagamihara, JP;
Takeshi Sawa, Kawasaki, JP;
Eiji Furuta, Sagamihara, JP;
Mitutoyo Corporation, Kanagawa, JP;
Abstract
A hardness test method performed by a controller of a hardness tester includes a first measurement process measuring an indentation curve (indentation history curve) for a plurality of times under a same condition with respect to a test specimen for verification in a predetermined environment; a setting process setting an acceptable range of variation in a load loading curve based on load loading curves (load loading history curves) of the plurality of the indentation curves obtained by the first measurement process; a second measurement process measuring an indentation curve under a same condition as the first measurement process with respect to the test specimen in an actual usage environment; and a judging process judging whether a load loading curve of the indentation curve measured by the second measurement process is within the acceptable range of variation in a load loading curve set by the setting process.